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Eric Vermote
University of Maryland - College Park

Biography:
Eric Vermote (M'95) received an engineering degree in computer science from Ecoles des Hautes Etudes Industrielles (H.E.I.), Lille, France, in 1986, and his Ph.D. degree in atmospheric optics from the University of Lille in 1990. He is currently an Associate Research Scientist in the Department of Geography, University of Maryland, College Park, working at NASA's Goddard Space Flight Center, Greenbelt, MD. He is an EOS/MODIS Science Team Member responsible for the atmospheric correction over land surfaces in the visible-to-middle infrared. His research interests cover radiative transfer modeling, vicarious calibration, atmospheric correction, and aerosol retrieval. He has been involved with remote sensing of land biophysical parameters since 1989. He is currently a Physical Scientist with NASA's Goddard Space Flight Center, Greenbelt, MD, and is primarily involved with the validation of Terra (EOS AM-1) products over global test sites.

Research Area:
"A global Land Surface Reflectance Product for use in the MODIS land algorithm."

The NASA Moderate Resolution Imaging Spectroradiometer (MODIS) instrument will provide a global and improved source of information for the study of land surfaces with a spatial resolution of up to 250m. Prior to the derivation of various biophysical parameters based on the surface reflectances, the top of the atmosphere signals need to be radiometrically calibrated and corrected for atmospheric effects. The research focus on establishing techniques that will be used for operational atmospheric correction of MODIS bands 1 through 7, centered at 648 nm , 858 nm, 470 nm, 555 nm, 1240 nm, 1640 nm, and 2130 nm, respectively. Previous operational correction schemes have assumed a standard atmosphere with zero or constant aerosol loading and a uniform, Lambertian surface. The MODIS operational atmospheric correction algorithm, will use aerosol and water vapor information derived from the MODIS data, corrects for adjacency effects and takes into account the directional properties of the observed surface.



 
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