Publications

Hwang, Jisoo (2014). Absolute measurement of hyperspectral and angular reflection. APPLIED OPTICS, 53(27), 6216-6221.

Abstract
A new instrument for absolute measurement of hyperspectral and angular reflection is presented. The instrument determines absolute values of angular reflection quantities in a wavelength range from 380 to 780 nm with a 3 nm spectral resolution by using a white source and a CCD-based spectroradiometer. Through uncertainty evaluation, the measurement uncertainty is determined as 1.4%-2.9% (k = 2) for white diffuse material of Spectralon. The gonioreflectometric determination and an integrating-sphere-based reflection measurement traceable to KRISS spectral reflectance scale are compared by determining hemispherical reflectance, which results in agreement in their uncertainties. (C) 2014 Optical Society of America

DOI:
10.1364/AO.53.006216

ISSN:
1559-128X